Ion beam studies of pure and nanoparticle (Si, Ag) embedded HfO2, thin films by Munthala Dhanunjaya; supervised by S.V.S. Nageswara Rao and A.P. Pathak
Dhanunjaya, Munthala| Call Number | TH530 D53I |
| Author | Dhanunjaya, Munthala |
| Title | Ion beam studies of pure and nanoparticle (Si, Ag) embedded HfO2, thin films by Munthala Dhanunjaya; supervised by S.V.S. Nageswara Rao and A.P. Pathak |
| Publication | Hyderabad: University of Hyderabad, 2018. |
| Physical Description | 145p. |
| Notes | Thesis (Ph.D) - School of Physics - University of Hyderabad |
| Added Author | Nageswara Rao, S.V.S.; supervisor Pathak, A.P.; Supervisor |
| Subject | PHYSICS - THESES |
| Multimedia |
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| Notes | Thesis (Ph.D) - School of Physics - University of Hyderabad |
| Subject | PHYSICS - THESES |
| Multimedia |