Superconducting Tc enhancement in weakly disordered Ge-covered tin films

dc.contributor.author Parashar, R. S.
dc.contributor.author Srivastava, Vipin
dc.date.accessioned 2022-03-26T23:44:12Z
dc.date.available 2022-03-26T23:44:12Z
dc.date.issued 1985-01-01
dc.description.abstract We report on the variation of the superconducting transition temperature with the electrical resistance ratio in weakly disordered Ge-covered tin films deposited at room temperature. The normal-state sheet resistance RN- varied between 0.2<RN-<4.2 /-. The transition temperature shows a maximum when the resistance ratio 7.5. Results are discussed in the light of the Anderson localization. © 1985 The American Physical Society.
dc.identifier.citation Physical Review B. v.32(9)
dc.identifier.issn 01631829
dc.identifier.uri 10.1103/PhysRevB.32.6048
dc.identifier.uri https://link.aps.org/doi/10.1103/PhysRevB.32.6048
dc.identifier.uri https://dspace.uohyd.ac.in/handle/1/2366
dc.title Superconducting Tc enhancement in weakly disordered Ge-covered tin films
dc.type Journal. Article
dspace.entity.type
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