Superconducting Tc enhancement in weakly disordered Ge-covered tin films

No Thumbnail Available
Date
1985-01-01
Authors
Parashar, R. S.
Srivastava, Vipin
Journal Title
Journal ISSN
Volume Title
Publisher
Abstract
We report on the variation of the superconducting transition temperature with the electrical resistance ratio in weakly disordered Ge-covered tin films deposited at room temperature. The normal-state sheet resistance RN- varied between 0.2<RN-<4.2 /-. The transition temperature shows a maximum when the resistance ratio 7.5. Results are discussed in the light of the Anderson localization. © 1985 The American Physical Society.
Description
Keywords
Citation
Physical Review B. v.32(9)