Measurement techniques for radio frequency nanoelectronics by T. Mitch Wallis and Pavel Kaboš
Wallis,T. Mitch| Call Number | 621.38412 W15M |
| Author | Wallis,T. Mitch |
| Title | Measurement techniques for radio frequency nanoelectronics by T. Mitch Wallis and Pavel Kaboš |
| Publication | Cambridge: Cambridge University Press, 2017. |
| Physical Description | 314p. |
| Series | Cambridge RF and microwave engineering series |
| Subject | Microsystèmes électromécaniques radiofréquences Radio frequency Measurement |
Total Ratings:
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$a Measurement techniques for radio frequency nanoelectronics $c by T. Mitch Wallis and Pavel Kaboš
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$a Cambridge RF and microwave engineering series
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$a Microsystèmes électromécaniques radiofréquences
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$a Radio frequency Measurement
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| Subject | Microsystèmes électromécaniques radiofréquences Radio frequency Measurement |