Reflection electron microscopy and spectroscopy for surface analysis / Zhong Lin Wang.
Wang, Zhong Lin.| Call Number | 620/.44 |
| Author | Wang, Zhong Lin, author. |
| Title | Reflection electron microscopy and spectroscopy for surface analysis / Zhong Lin Wang. Reflection Electron Microscopy & Spectroscopy for Surface Analysis |
| Physical Description | 1 online resource (xix, 436 pages) : digital, PDF file(s). |
| Notes | Title from publisher's bibliographic system (viewed on 05 Oct 2015). |
| Summary | In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature. |
| Subject | Materials Microscopy. Surfaces (Technology) Analysis. Reflection electron microscopy. |
| Multimedia |
Total Ratings:
0
02251nam a22003858i 4500
001
vtls001584776
003
VRT
005
20200921122100.0
006
m|||||o||d||||||||
007
cr||||||||||||
008
200921s1996||||enk o ||1 0|eng|d
020
$a 9780511525254 (ebook)
020
$z 9780521482660 (hardback)
020
$z 9780521017954 (paperback)
035
$a (UkCbUP)CR9780511525254
039
9
$y 202009211221 $z santha
040
$a UkCbUP $b eng $e rda $c UkCbUP
050
0
0
$a TA417.23 $b .W36 1996
082
0
0
$a 620/.44 $2 20
100
1
$a Wang, Zhong Lin, $e author.
245
1
0
$a Reflection electron microscopy and spectroscopy for surface analysis / $c Zhong Lin Wang.
246
3
$a Reflection Electron Microscopy & Spectroscopy for Surface Analysis
264
1
$a Cambridge : $b Cambridge University Press, $c 1996.
300
$a 1 online resource (xix, 436 pages) : $b digital, PDF file(s).
336
$a text $b txt $2 rdacontent
337
$a computer $b c $2 rdamedia
338
$a online resource $b cr $2 rdacarrier
500
$a Title from publisher's bibliographic system (viewed on 05 Oct 2015).
520
$a In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature.
650
0
$a Materials $x Microscopy.
650
0
$a Surfaces (Technology) $x Analysis.
650
0
$a Reflection electron microscopy.
776
0
8
$i Print version: $z 9780521482660
856
4
0
$u https://doi.org/10.1017/CBO9780511525254
999
$a VIRTUA
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| Summary | In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature. |
| Notes | Title from publisher's bibliographic system (viewed on 05 Oct 2015). |
| Subject | Materials Microscopy. Surfaces (Technology) Analysis. Reflection electron microscopy. |
| Multimedia |