Electromigration in thin films and electronic divices. materials and reliability. eddited by Choong-Un Kim.
Kim, Choong-Un.Call Number | 621.381 K56E |
Author | Kim, Choong-Un. |
Title | Electromigration in thin films and electronic divices. materials and reliability. eddited by Choong-Un Kim. |
Publication | Oxford : Woodhead Publishing , 2011. |
Physical Description | 340p. |
Series | Woodhead Publishing in Materials. |
Subject | ELECTRONIC DEVICES. |
Total Ratings:
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Subject | ELECTRONIC DEVICES. |