Frontiers of charecterization and metrology for nanoelectronics proceedings (with CD) edited by David G. Seiler and others
| Call Number | 621.3815 F92- |
| Title | Frontiers of charecterization and metrology for nanoelectronics proceedings (with CD) edited by David G. Seiler and others |
| Publication | New York : American Institute of Physics , 2007 |
| Physical Description | 578p. CD disk |
| Series | American Institute of Physics conference prceedings ;V.931 |
| Added Author | Seiler, David G.,ed. |
| Subject | NANOELECTRONICS MOLECULAR ELECTRONICS Metrlogy |
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| Subject | NANOELECTRONICS MOLECULAR ELECTRONICS Metrlogy |