Fundamentals of nanoscale film analysis Terry L. Alford, Leonard C. Feldman and James W. Mayer.
Alford, Terry L.| Call Number | 530.41 Al28F |
| Author | Alford, Terry L. |
| Title | Fundamentals of nanoscale film analysis Terry L. Alford, Leonard C. Feldman and James W. Mayer. |
| Publication | New York : Springer, 2007. |
| Physical Description | xiv, 336 p. : ill. ; 25 cm. |
| Added Author | Feldman, Leonard C. Mayer, James W. |
| Subject | THIN FILMS. Nanostructured materials. |
| Multimedia |
Total Ratings:
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$a Fundamentals of nanoscale film analysis $c Terry L. Alford, Leonard C. Feldman and James W. Mayer.
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$a xiv, 336 p. : $b ill. ; $c 25 cm.
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$a Includes bibliographical references and index.
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$a THIN FILMS.
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$a Nanostructured materials.
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$a Feldman, Leonard C.
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$a Mayer, James W.
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| Subject | THIN FILMS. Nanostructured materials. |
| Multimedia |