An introduction to surface analysis by XPS and AES by John F. Watts and John Wolstenholme
Watts, John| Call Number | 620.4 W34I |
| Author | Watts, John |
| Title | An introduction to surface analysis by XPS and AES by John F. Watts and John Wolstenholme |
| Edition | 2nd ed. |
| Publication | New Jersey, USA: Wiley Pub., 2020. |
| Physical Description | xviii, 267 p. |
| Added Author | Wolstenholme, John |
| Subject | Surfaces (Technology) Analysis. ELECTRON SPECTROSCOPY. PHOTOELECTRON SPECTROSCOPY. Auger effect. |
Total Ratings:
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$a An introduction to surface analysis by XPS and AES $c by John F. Watts and John Wolstenholme
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$a xviii, 267 p.
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$a Includes bibliographical references and index.
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$a Surfaces (Technology) $x Analysis.
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$a ELECTRON SPECTROSCOPY.
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$a PHOTOELECTRON SPECTROSCOPY.
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$a Auger effect.
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| Subject | Surfaces (Technology) Analysis. ELECTRON SPECTROSCOPY. PHOTOELECTRON SPECTROSCOPY. Auger effect. |