Electromigration in thin films and electronic divices. materials and reliability. eddited by Choong-Un Kim.
Kim, Choong-Un.| Call Number | 621.381 K56E |
| Author | Kim, Choong-Un. |
| Title | Electromigration in thin films and electronic divices. materials and reliability. eddited by Choong-Un Kim. |
| Publication | Oxford : Woodhead Publishing , 2011. |
| Physical Description | 340p. |
| Series | Woodhead Publishing in Materials. |
| Subject | ELECTRONIC DEVICES. |
Total Ratings:
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$a Electromigration in thin films and electronic divices. $b materials and reliability. $c eddited by Choong-Un Kim.
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| Subject | ELECTRONIC DEVICES. |