Applied scanning probe methods X Bharat Bhushan, Harald Fuchs, Sumio Hosaka [eds.].
Bhushan, Bharat.| Call Number | 537.5352 B46A |
| Author | Bhushan, Bharat |
| Title | Applied scanning probe methods X Bharat Bhushan, Harald Fuchs, Sumio Hosaka [eds.]. |
| Publication | Berlin ; New York: Springer, 2004. |
| Physical Description | v. : ill. (some col.), maps ; 24 cm. |
| Series | Nanoscience and technology |
| Contents | [v. 1]. [without special title] -- v. 3. Characterization -- v. 4. Industrial applications. |
| Added Author | Bhushan, Bharat, 1949- Fuchs, H. Hosaka, Sumio. |
| Subject | Materials Microscopy. Scanning probe microscopy. |
Total Ratings:
0
01182cam a2200301Ia 4500
001
vtls001455432
003
VRT
005
20160719152800.0
008
060727m2004uuuugw ab b 001 0 eng d
020
$a 3540005277 ([v. 1])
020
$a 3540269126 (v. 4)
039
9
$a 201607191528 $b thirupathi $c 200905021508 $d pjr $c 200609011143 $d pjr $c 200605031202 $d srinu $y 200605031200 $z srinu
082
$a 537.5352 $b B46A
100
$a Bhushan, Bharat
245
0
0
$a Applied scanning probe methods X $c Bharat Bhushan, Harald Fuchs, Sumio Hosaka [eds.].
260
$a Berlin ; $a New York: $b Springer, $c 2004.
300
$a v. : $b ill. (some col.), maps ; $c 24 cm.
440
0
$a Nanoscience and technology
504
$a Includes bibliographical references and indexes.
505
1
$a [v. 1]. [without special title] -- v. 3. Characterization -- v. 4. Industrial applications.
650
0
$a Materials $x Microscopy.
650
0
$a Scanning probe microscopy.
700
1
$a Bhushan, Bharat, $d 1949-
700
1
$a Fuchs, H. $q (Harald)
700
1
$a Hosaka, Sumio.
994
$a C0 $b IIUOH
999
$a VIRTUA
999
$a VTLSSORT0080*0200*0201*0820*1000*2450*2600*3000*4400*5040*5050*6500*6501*7000*7001*7002*9940*9992
No Reviews to Display
| Contents | [v. 1]. [without special title] -- v. 3. Characterization -- v. 4. Industrial applications. |
| Subject | Materials Microscopy. Scanning probe microscopy. |