Lock-in thermography : basics and use for functional diagnostics of electronic components / O. Breitenstein, M. Langenkamp.
Breitenstein, O. (Otwin)| Call Number | 621.381 B74L |
| Author | Breitenstein, O. |
| Title | Lock-in thermography : basics and use for functional diagnostics of electronic components / O. Breitenstein, M. Langenkamp. |
| Publication | Berlin ; New York : Springer, c2003. |
| Physical Description | viii, 193 p. : ill. (some col.) ; 24 cm. |
| Series | Springer series in advanced microelectronics ; 10 |
| Added Author | Langenkamp, M. 1964- |
| Subject | Electronic apparatus and appliances Thermal properties. Electronic apparatus and appliances Testing. Semiconductors Thermal properties. Thermography. |
Total Ratings:
0
01403nam a22003614a 4500
001
vtls001456267
003
VRT
005
20060814154200.0
008
030128s2003 gw a b 001 0 eng c
010
$a 2003-042481
015
$a GBA3-Y6886
020
$a 3540434399 (alk. paper)
029
1
$a UKM $b bA3Y6886
039
9
$a 200608141542 $b 361 $c 200607041032 $d 696yak $y 200607041032 $z 696yak
040
$a COO $c COO $d UKM
042
$a pcc
049
$a IIUOH
072
7
$a TK $2 lcco
082
0
0
$a 621.381 $b B74L
100
1
$a Breitenstein, O. $q (Otwin)
245
1
0
$a Lock-in thermography : $b basics and use for functional diagnostics of electronic components / $c O. Breitenstein, M. Langenkamp.
260
$a Berlin ; $a New York : $b Springer, $c c2003.
300
$a viii, 193 p. : $b ill. (some col.) ; $c 24 cm.
440
0
$a Springer series in advanced microelectronics ; $v 10
504
$a Includes bibliographical references (p. [173]-179) and index.
650
0
$a Electronic apparatus and appliances $x Thermal properties.
650
0
$a Electronic apparatus and appliances $x Testing.
650
0
$a Semiconductors $x Thermal properties.
650
0
$a Thermography.
700
1
$a Langenkamp, M. $q (Martin), $d 1964-
994
$a C0 $b IIUOH
999
$a VIRTUA
999
$a VTLSSORT0010*0030*0080*0100*0400*0150*0200*0290*0420*0720*0820*0490*1000*2450*2600*3000*4400*5040*6500*6501*6502*6503*7000*9940*9991
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| Subject | Electronic apparatus and appliances Thermal properties. Electronic apparatus and appliances Testing. Semiconductors Thermal properties. Thermography. |