Measurement of refractive index of biaxial potassium titanyl phosphate crystal plate using reflection spectroscopic ellipsometry technique

dc.contributor.author Chaudhary, A. K.
dc.contributor.author Molla, A.
dc.contributor.author Asfaw, A.
dc.date.accessioned 2022-03-26T14:45:56Z
dc.date.available 2022-03-26T14:45:56Z
dc.date.issued 2009-10-01
dc.description.abstract The paper reports the measurement of refractive indices and anisotropic absorption coeffcients of biaxial potassium titanyl phosphate (KTP) crystal in the form of thin plate using reflection ellipsometry technique. This experiment is designed in the Graduate Optics Laboratory of the Addis Ababa University and He-Ne laser (λ = 632:8 nm), diode laser (λ = 670:0 nm) and temperature-tuned diode laser (λ = 804:4 and 808.4 nm), respectively have been employed as source. The experimental data for nx, ny are fitted to the Marquardt-Levenberg theoretical model of curve fitting. The obtained experimental data of refractive indices are compared with different existing theoretical and experimental values of KTP crystals and found to be in good agreement with them.
dc.identifier.citation Pramana - Journal of Physics. v.73(4)
dc.identifier.issn 03044289
dc.identifier.uri 10.1007/s12043-009-0141-5
dc.identifier.uri http://link.springer.com/10.1007/s12043-009-0141-5
dc.identifier.uri https://dspace.uohyd.ac.in/handle/1/2166
dc.subject Ellipsometry
dc.subject He-Ne laser
dc.subject Lock-in amplifier
dc.subject Potassium titanyl phosphate
dc.title Measurement of refractive index of biaxial potassium titanyl phosphate crystal plate using reflection spectroscopic ellipsometry technique
dc.type Journal. Article
dspace.entity.type
Files
License bundle
Now showing 1 - 1 of 1
No Thumbnail Available
Name:
license.txt
Size:
1.71 KB
Format:
Plain Text
Description: