Structural and optical properties of zirconia thin films

dc.contributor.author Krishna, M. Ghanashyam
dc.contributor.author Rao, K. Narasimha
dc.contributor.author Mohan, S.
dc.date.accessioned 2022-03-27T06:41:25Z
dc.date.available 2022-03-27T06:41:25Z
dc.date.issued 1990-12-01
dc.description.abstract Thin films of zirconia have been deposited using reactive electron beam evaporation in neutral and ionized oxygen media. The variation in optical properties and structure with post-deposition annealing temperature in the range 300-850°C has been studied. It has been found that the refractive index decreases and the extinction coefficient increases with increasing annealing temperature. Phase transitions have been characterized using IR absorption in conjunction with X-ray diffraction. The effect of ambient background ions on optical properties is not as marked as that on structure.
dc.identifier.citation Thin Solid Films. v.194(1 -2 pt 2)
dc.identifier.issn 00406090
dc.identifier.uri https://dspace.uohyd.ac.in/handle/1/9715
dc.title Structural and optical properties of zirconia thin films
dc.type Journal. Article
dspace.entity.type
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